This tutorial demonstrates how to use the OptoTherm Micro thermal imaging microscope to identify hot spots on a semiconductor die. Power is applied to one of the diodes on a test die to generate a hot spot. The Micro electonics analysis software includes tools to detect and locate hot spots and short circuits that exhibit very low levels of heating. Temperature changes below 1C can be detected.

https://www.youtube.com/watch?v=qWktDsbYxpU