EPS150FA

EPS150FA

  • EPS150FA.
  • 150 mm manual probe system for failure analysis and design debug.
  • Mã sản phẩm: EPS150FA
  • Xuất xứ: USA
  • Kho hàng: Có sẵn
  • Khuyến mại: 12 tháng
  • Tài liệu: Tải về
Thêm vào giỏ

EPS150FA Overview

Visualize Success by Analyzing Sub-Micron Failure

Electrical failure verification, localization and debug with the ability to probe features smaller than 1 μm. Flexibility to adapt from wafer-to-chip-to-package investigation in a matter of seconds, minimizing time-to-data and ultimately delivering faster time to market.

Applications: Failure Analysis

EPS150FA Key Features

EPS150FA - High quality optics

High Magnification Optics

  • Stable microscope bridge design and XY microscope
  • Up to 4000x magnification (option)
  • Laser cut and camera ready
  • Easy navigation and high quality image
  • Contact submicron features
  • Easy upgrade

EPS150FA with flexible design

Flexible Design

  • Probe card simultaneously used with single needles (option)
  • Movable platen enables single DUT holder
  • Chuck ready for single DUT
  • Flexible and fast setup change
  • Quickest transition from wafer-to-chip-to-package
  • Versatile upgrade paths
EPS150FA - Vacuum positioner

Vacuum Positioner

  • 200 TPI with <1 μm accuracy
  • DPP450 positioner with nanometer resolution and accuracy (option)
  • Backlash free
  • High positioning accuracy comparable to semi-automated systems
  • Fast and precise positioning
  • Probe smallest DUTs without damage

 

 

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