- EPS150FA
- Mã sản phẩm: EPS150FA
- Xuất xứ: USA
- Bảo hành: 12 tháng
- Trạng thái: Đặt hàng
- EPS150FA.
- 150 mm manual probe system for failure analysis and design debug.Hotline: 02439942289
EPS150FA Overview
Visualize Success by Analyzing Sub-Micron Failure
Electrical failure verification, localization and debug with the ability to probe features smaller than 1 μm. Flexibility to adapt from wafer-to-chip-to-package investigation in a matter of seconds, minimizing time-to-data and ultimately delivering faster time to market.
Applications: Failure AnalysisEPS150FA Key Features
High Magnification Optics
- Stable microscope bridge design and XY microscope
- Up to 4000x magnification (option)
- Laser cut and camera ready
- Easy navigation and high quality image
- Contact submicron features
- Easy upgrade
Flexible Design
- Probe card simultaneously used with single needles (option)
- Movable platen enables single DUT holder
- Chuck ready for single DUT
- Flexible and fast setup change
- Quickest transition from wafer-to-chip-to-package
- Versatile upgrade paths
Vacuum Positioner
- 200 TPI with <1 μm accuracy
- DPP450 positioner with nanometer resolution and accuracy (option)
- Backlash free
- High positioning accuracy comparable to semi-automated systems
- Fast and precise positioning
- Probe smallest DUTs without damage