EPS150RF Overview

Make the Most of Your RF Expertise

Our packaged RF solution enables precise probe placement on pads as small as 25 μm x 35 μm with 1 μm contact repeatability. Choose from three RF probe technologies to achieve the best solution for the widest application spectrum. WinCal XE™ software provides LRRM and LRM+ methods superior calibration accuracy.

Applications: RF/mmW

EPS150RF Key Features

Three Probe Technologies

• Infinity Probe: best for Al (Si)
• ACP Probe: best for AU (III-Vs)
• |Z| Probe: robust solution (long lifetime)
• Precision contact on a wide variety of materials from 26 GHz to 67 GHz
• Accurate results with excellent crosstalk
• Matching cables and substrates included

Precise Contact Solution

• RF chuck ±3 μm surface planarity
• Unique 200 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
• Precision probe alignment
• Consistent contact force and overtravel
• Stable contact performance

WinCal XE Calibration Software

• Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
• Automated calibration monitoring
• Unique measurement & analysis methods
• Accurate S-parameter measurements
• Automatic calibration setup for higher efficiency
• Fast and easy data interpretation and reporting